• DocumentCode
    2578010
  • Title

    A high-sensitivity polyimide humidity sensor for monitoring hermetic micropackages

  • Author

    Dokmeci, M. ; Najafi, K.

  • Author_Institution
    Center for Integrated Micro Syst., Michigan Univ., Ann Arbor, MI, USA
  • fYear
    1999
  • fDate
    21-21 Jan. 1999
  • Firstpage
    279
  • Lastpage
    284
  • Abstract
    This paper presents the fabrication and characterization of a high-sensitivity polyimide-based humidity sensor for monitoring internal humidity level in anodically-bonded hermetic micropackages. This capacitive sensor is 1 mm on a side, and utilizes CU1512 polyimide film with a thickness in the range of 300-1200 /spl Aring/ sandwiched between 2 metal electrodes to sense moisture. The measured sensitivity for a sensor with a 1200 /spl Aring/-thick film is 0.86 pF/%RH, and for a 300 /spl Aring/-thick sensor is 3.4 pF/%RH. The sensor has been exposed to and survived a one-hour test at 400/spl deg/C, which is the temperature typically used to perform anodic bonding. Measurements show an offset drift of less than 1% RH at 50% RH and 37/spl deg/C, and a hysteresis of <2% RH over a range of 30-70% RH for a 1200 /spl Aring/-thick polyimide film sensor.
  • Keywords
    capacitive sensors; humidity sensors; microsensors; moisture measurement; polymer films; seals (stoppers); semiconductor device packaging; wafer bonding; 1 mm; 1200 angstrom; 300 to 1000 angstrom; 37 C; anodic bonding; anodically-bonded packages; capacitive sensor; fabrication; hermetic micropackages monitoring; high-sensitivity; hysteresis; internal humidity level; low offset drift; moisture measurement; polyimide humidity sensor; Capacitive sensors; Electrodes; Fabrication; Humidity; Moisture; Monitoring; Polyimides; Sensor phenomena and characterization; Temperature sensors; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Micro Electro Mechanical Systems, 1999. MEMS '99. Twelfth IEEE International Conference on
  • Conference_Location
    Orlando, FL, USA
  • ISSN
    1084-6999
  • Print_ISBN
    0-7803-5194-0
  • Type

    conf

  • DOI
    10.1109/MEMSYS.1999.746835
  • Filename
    746835