Title :
High resolution optical waveform sampling
Author :
Andrekson, Peter A.
Author_Institution :
Dept. of Microtechnol. & Nanosci., Chalmers Univ. of Technol., Gothenburg
Abstract :
Techniques to analyze optical waveforms with high resolution are discussed. Emphasis is on all-optical sampling based on fiber-optic parametric amplifiers that offer high resolution with excellent sensitivity.
Keywords :
optical fibre amplifiers; optical parametric amplifiers; all-optical sampling; fiber-optic parametric amplifiers; high resolution optical waveform sampling; Bandwidth; Fiber nonlinear optics; High speed optical techniques; Nonlinear optics; Optical distortion; Optical filters; Optical sensors; Optical wavelength conversion; Sampling methods; Stimulated emission;
Conference_Titel :
IEEE/LEOS Winter Topicals Meeting Series, 2009
Conference_Location :
Innsbruck
Print_ISBN :
978-1-4244-2610-2
Electronic_ISBN :
978-1-4244-2611-9
DOI :
10.1109/LEOSWT.2009.4771720
