DocumentCode
2578227
Title
Fabrication of optical micro-cantilever consisting of channel waveguide for scanning near-field optical microscopy controlled by atomic force
Author
Niwa, T. ; Kato, K. ; Ichihara, S. ; Chiba, N. ; Mitsuoka, Y. ; Oumi, M. ; Shinogi, M. ; Nakajima, K. ; Muramatsu, H. ; Sakuhara, T. ; Shikida, M. ; Sato, K.
Author_Institution
Seiko Instrum. Inc., Chiba, Japan
fYear
1999
fDate
21-21 Jan. 1999
Firstpage
355
Lastpage
359
Abstract
We developed a novel optical micro-cantilever for scanning near-field optical microscopy (SNOM), evaluated its mechanical properties, and applied it for SNOM. A cantilever-shaped channel waveguide with an aperture is bent and it is operated in atomic force mode. By combining the conventional lithography techniques and the waveguide bending process, we can fabricate a probe with the shape and the mechanical properties most desirable for given samples and conditions. Our optical micro-cantilever has resonance frequency similar to the conventional optical fiber probe, and it has a spring constant much smaller. We used this optical micro-cantilever for SNOM in contact mode, and confirmed that it gives optical images with a resolution beyond the diffraction limit.
Keywords
atomic force microscopy; micro-optics; near-field scanning optical microscopy; optical fabrication; optical waveguides; atomic force mode; bending; channel waveguide; contact mode; image resolution; lithography; mechanical properties; optical micro-cantilever; probe fabrication; resonance frequency; scanning near-field optical microscopy; spring constant; Apertures; Atom optics; Lithography; Mechanical factors; Optical device fabrication; Optical microscopy; Optical waveguides; Probes; Resonance; Shape;
fLanguage
English
Publisher
ieee
Conference_Titel
Micro Electro Mechanical Systems, 1999. MEMS '99. Twelfth IEEE International Conference on
Conference_Location
Orlando, FL, USA
ISSN
1084-6999
Print_ISBN
0-7803-5194-0
Type
conf
DOI
10.1109/MEMSYS.1999.746854
Filename
746854
Link To Document