Towards real-time testing of clocked Quantum Dot Cellular Automata

Author

Tang, Yong ; Orlov, Alexei O. ; Snider, Gregory L. ; Fay, Patrick J.

Author_Institution

Dept. of Electr. Eng., Univ. of Notre Dame, Notre Dame, IN, USA

fYear

2009

fDate

2-5 June 2009

Firstpage

76

Lastpage

79

Abstract

We present a real-time measurement of electron switching in clocked Quantum-Dot Cellular Automata (QCA) circuit, a QCA latch. A capacitively coupled radio frequency single electron transistor (RF-SET) with carrier frequency at 991.2 MHz is used as read-out electrometer. Reflection-mode detection of the SET impedance provides a fast response to changes of charge configuration in the latch dots. We demonstrate a QCA latch with operating temperature above 300 milli-Kelvin and clocking speed of 5 musec.

Keywords

cellular automata; clocks; flip-flops; logic design; logic testing; QCA latch; SET impedance; capacitively coupled radio frequency single electron transistor; carrier frequency; clocked quantum dot cellular automata circuit; electron switching; frequency 991.2 MHz; read-out electrometer; real-time measurement; reflection-mode detection; Automatic testing; Circuit testing; Clocks; Coupling circuits; Electrons; Latches; Quantum cellular automata; Quantum dots; Radio frequency; Switching circuits;

fLanguage

English

Publisher

ieee

Conference_Titel

Nanotechnology Materials and Devices Conference, 2009. NMDC '09. IEEE

Conference_Location

Traverse City, MI

Print_ISBN

978-1-4244-4695-7

Electronic_ISBN

978-1-4244-4696-4

Type

conf

DOI

10.1109/NMDC.2009.5167545

Filename

5167545