Title :
Towards real-time testing of clocked Quantum Dot Cellular Automata
Author :
Tang, Yong ; Orlov, Alexei O. ; Snider, Gregory L. ; Fay, Patrick J.
Author_Institution :
Dept. of Electr. Eng., Univ. of Notre Dame, Notre Dame, IN, USA
Abstract :
We present a real-time measurement of electron switching in clocked Quantum-Dot Cellular Automata (QCA) circuit, a QCA latch. A capacitively coupled radio frequency single electron transistor (RF-SET) with carrier frequency at 991.2 MHz is used as read-out electrometer. Reflection-mode detection of the SET impedance provides a fast response to changes of charge configuration in the latch dots. We demonstrate a QCA latch with operating temperature above 300 milli-Kelvin and clocking speed of 5 musec.
Keywords :
cellular automata; clocks; flip-flops; logic design; logic testing; QCA latch; SET impedance; capacitively coupled radio frequency single electron transistor; carrier frequency; clocked quantum dot cellular automata circuit; electron switching; frequency 991.2 MHz; read-out electrometer; real-time measurement; reflection-mode detection; Automatic testing; Circuit testing; Clocks; Coupling circuits; Electrons; Latches; Quantum cellular automata; Quantum dots; Radio frequency; Switching circuits;
Conference_Titel :
Nanotechnology Materials and Devices Conference, 2009. NMDC '09. IEEE
Conference_Location :
Traverse City, MI
Print_ISBN :
978-1-4244-4695-7
Electronic_ISBN :
978-1-4244-4696-4
DOI :
10.1109/NMDC.2009.5167545
