DocumentCode :
2578603
Title :
Evaluation of mask soaking performance in the thermal stabilized vacuum chamber in an EB mask writer
Author :
Mitsui, S. ; Akeno, K. ; Ogasawara, M. ; Tojo, T.
Author_Institution :
ASET EUV Kawasaki Branch Lab., Japan
fYear :
2003
fDate :
29-31 Oct. 2003
Firstpage :
104
Lastpage :
105
Abstract :
In this paper, a new thermally stabilized vacuum chamber with improved soaking efficiency is constructed and its performance is evaluated.
Keywords :
electron beam lithography; masks; vacuum apparatus; EB mask writer; mask soaking; thermal stabilized vacuum chamber; Electrical resistance measurement; Rapid thermal processing; Robust control; Temperature control; Temperature measurement; Thermal factors; Thermal loading; Thermal management; Thermal resistance; Writing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microprocesses and Nanotechnology Conference, 2003. Digest of Papers. 2003 International
Conference_Location :
Tokyo, Japan
Print_ISBN :
4-89114-040-2
Type :
conf
DOI :
10.1109/IMNC.2003.1268597
Filename :
1268597
Link To Document :
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