Positronics of IR transmitting chalcohalide glass-ceramics

Positron annihilation lifetime spectroscopy combined with Doppler broadening of annihilation radiation was applied to study free-volume entities in Ge-Ga-S glasses having different amount of CsCl additives. These results serve as a basis for new direction in the characterization of inner free-volume structure of chalcohalide glass-ceramics conditionally declared as Positronics.