• DocumentCode
    2579007
  • Title

    Advanced feature set for face recognition under assorted lighting conditions

  • Author

    Lincy, T. ; Karuppanan, Komathy

  • Author_Institution
    Dept. of Comput. Sci. & Eng., Anna Univ., Chennai, India
  • fYear
    2011
  • fDate
    3-5 June 2011
  • Firstpage
    975
  • Lastpage
    980
  • Abstract
    Matching face image under assorted lighting conditions is a challenging task in a face recognition system (FRS). The feature extraction method used in Local Binary Pattern (LBP) fails in detecting the eye position and it is less sensitive to noise in uniform image regions. This paper proposes an Advanced Ternary Pattern (ATP) feature set to overcome these issues. The issue on noise sensitivity in uniform image regions such as cheeks and forehead is attempted to resolve using the normalization technique which regularizes all the extracted features under various lighting conditions. ATP feature set uses the Efficient Feature Orientation (EFO) method for effective and accurate face normalization. The proposed model improves the Face Verification Rate (FVR) up to 90% for the less dark images and about 78% for fully dark images. Experimental results show that the proposed scheme makes FRS insensitive to illumination.
  • Keywords
    face recognition; feature extraction; image denoising; image matching; object detection; ATP feature set; EFO method; advanced ternary pattern; assorted lighting condition; efficient feature orientation; eye position detection; face image matching; face recognition system; face verification rate; feature extraction; image region; local binary pattern; noise removal; noise sensitivity; normalization technique; Face; Face recognition; Feature extraction; Histograms; Lighting; Noise; Pixel; Feature extraction; illumination; image classification; local ternary pattern; noise removal;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Recent Trends in Information Technology (ICRTIT), 2011 International Conference on
  • Conference_Location
    Chennai, Tamil Nadu
  • Print_ISBN
    978-1-4577-0588-5
  • Type

    conf

  • DOI
    10.1109/ICRTIT.2011.5972441
  • Filename
    5972441