Title :
New Insight On Electromigration Failure Mechanism And Its Impact On Design Guidelines
Author :
Jawarani, D. ; Gall, M. ; Hernandez, R. ; Capasso, C. ; Kawasaki, H.
Author_Institution :
Advanced Products Research and Development Laboratory, Motorola 3501 Ed Bluestein Blvd., Austin, TX 78721, USA
Conference_Titel :
VLSI Technology, 1997. Digest of Technical Papers., 1997 Symposium on
Print_ISBN :
4-930813-75-1
DOI :
10.1109/VLSIT.1997.623684
