New Insight On Electromigration Failure Mechanism And Its Impact On Design Guidelines

Author

Jawarani, D. ; Gall, M. ; Hernandez, R. ; Capasso, C. ; Kawasaki, H.

Author_Institution

Advanced Products Research and Development Laboratory, Motorola 3501 Ed Bluestein Blvd., Austin, TX 78721, USA

fYear

1997

fDate

10-12 June 1997

Firstpage

Lastpage

fLanguage

English

Publisher

ieee

Conference_Titel

VLSI Technology, 1997. Digest of Technical Papers., 1997 Symposium on

Print_ISBN

4-930813-75-1

Type

DOI

10.1109/VLSIT.1997.623684

Filename

623684

Link To Document