DocumentCode :
2579327
Title :
Application of solderable devices for assembling three-dimensional power electronics modules
Author :
Lu, Guo-Quan ; Liu, Xingslieng
Author_Institution :
Power Electron. Packaging Lab., Virginia Polytech. Inst. & State Univ., Blacksburg, VA, USA
Volume :
3
fYear :
2000
fDate :
2000
Firstpage :
1261
Abstract :
Power semiconductor bond wires are known to cause high interconnection resistance, switching noise, parasitic oscillations, nonuniform current distribution, and fatigue failure. The wire-bonded device and modules are also limited to unidirectional heat dissipation that limits packaging density. Consequently, they are difficult to integrate into three-dimensional multichip packages that are expected to offer improved system performance. Our research and development efforts aim to investigate three-dimensional packaging of integrated power electronics modules (IPEMs) where interconnections are provided via bond-wireless techniques. This paper presents the application of solderable power devices for building 30 kW, 3-D bond-wireless IPEMs. Experimental results show that the solder interconnection of power devices in the modules significantly lowers resistance, parasitics, and noise
Keywords :
assembling; modules; power semiconductor devices; semiconductor device manufacture; semiconductor device packaging; soldering; 30 kW; bond-wireless techniques; fatigue failure; high interconnection resistance; integrated power electronics modules; noise reduction; nonuniform current distribution; packaging density; parasitic oscillations; parasitics reduction; power semiconductor bond wires; resistance reduction; solder interconnection; solderable devices; solderable power devices; switching noise; three-dimensional multichip packages; three-dimensional packaging; three-dimensional power electronics modules; unidirectional heat dissipation; wire-bonded device; wire-bonded modules; Assembly; Bonding; Current distribution; Electronics packaging; Fatigue; Power semiconductor switches; Power system interconnection; Semiconductor device noise; Semiconductor device packaging; Wires;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Power Electronics Specialists Conference, 2000. PESC 00. 2000 IEEE 31st Annual
Conference_Location :
Galway
ISSN :
0275-9306
Print_ISBN :
0-7803-5692-6
Type :
conf
DOI :
10.1109/PESC.2000.880491
Filename :
880491
Link To Document :
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