DocumentCode
2579543
Title
Preliminary experimental evaluation on PT-IGBT in parallel connection
Author
Selgi, Lorenzo M. ; Sorrentino, Giuseppe ; Fragapane, Leonardo ; Melito, Maurizio
Author_Institution
STMicroelectronics Stradale Primosole, Catania
fYear
2007
fDate
2-5 Sept. 2007
Firstpage
1
Lastpage
8
Abstract
This paper presents the problems associated with the parallel connection of punch through IGBTs, such as: thermal stability and current balance. An experimental investigation is conducted in the simplest case of two IGBT working in hard switching on an inductive load; a thermal analysis was performed by means of an infrared camera.
Keywords
insulated gate bipolar transistors; power semiconductor switches; thermal analysis; PT IGBT; current balance; hard switching; infrared camera; parallel connection; punch through IGBT; thermal analysis; thermal stability; Heat sinks; Insulated gate bipolar transistors; MOSFET circuits; Negative feedback; Switches; Temperature; Thermal conductivity; Thermal stability; Uniform resource locators; Voltage; IGBT; Parallel operation;
fLanguage
English
Publisher
ieee
Conference_Titel
Power Electronics and Applications, 2007 European Conference on
Conference_Location
Aalborg
Print_ISBN
978-92-75815-10-8
Electronic_ISBN
978-92-75815-10-8
Type
conf
DOI
10.1109/EPE.2007.4417270
Filename
4417270
Link To Document