• DocumentCode
    2580110
  • Title

    Current-mode CMOS pipelined ADC

  • Author

    Krishna, Siva R. ; Baghini, Maryam Shojaei ; Mukherjee, Jayanta

  • Author_Institution
    Dept. of Electr. Eng., IIT-Bombay, Mumbai, India
  • fYear
    2009
  • fDate
    18-23 May 2009
  • Firstpage
    205
  • Lastpage
    210
  • Abstract
    CMOS technology scaling trends and power requirements demand circuits which operate at lower supply voltages. However threshold voltage scaling doesn´t exactly follow supply voltage scaling. Therefore circuit techniques like current-mode circuits, which are less sensitive to supply voltage level, are required. In this direction and in the context of mixed-signal design this paper presents two 6-bit pipelined current-mode ADCs in UMC 0.18 um MM (mixed-mode) CMOS process, one for high- speed & low-power and the other for high-resolution applications. Digital error correction has been taken care while designing the ADCs. The maximum sampling rate, average power dissipation and SNR for the first designed ADC, aimed for low-power and high-speed applications are 50 MSPS, 56.38 mW & 36.33 dB, respectively. Similar specifications for another designed ADC, aimed for high-resolution applications, are 16.67 MSPS, 113.5 mW and 38.74 dB, respectively. The ADCs are designed and simulated in UMC 0.18 mum CMOS technology. using Mentor Graphics Custom IC Design tool set.
  • Keywords
    CMOS integrated circuits; analogue-digital conversion; error correction; mixed analogue-digital integrated circuits; 0.18 um MM CMOS; ADC; CMOS pipeline; current-mode circuits; digital error correction; power 11.5 mW; power 56.38 mW; power dissipation; sampling rate; voltage scaling; Analog-digital conversion; CMOS process; CMOS technology; Current mode circuits; Error correction; Impedance; Mirrors; Power dissipation; Sampling methods; Threshold voltage; Current-Mode ADC; Data Converters Pipelined ADC;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    EUROCON 2009, EUROCON '09. IEEE
  • Conference_Location
    St.-Petersburg
  • Print_ISBN
    978-1-4244-3860-0
  • Electronic_ISBN
    978-1-4244-3861-7
  • Type

    conf

  • DOI
    10.1109/EURCON.2009.5167631
  • Filename
    5167631