Improved techniques for cost effective electronics

Problems that can arise from use of the concepts of failure prediction methodology (FPM) in the reverse manner for engineering guidance are described. This work emphasizes the need for fundamentally sound knowledge of causes of failures, their accelerators, and the costs and benefits of techniques to reduce or avoid failures in order to aid designers in achieving cost-effective designs. Temperature is suggested as a perceived major failure accelerator, and the costs of its reduction and its influence on product development are discussed. Certain passive cooling techniques are described. Inherent reliability, and the usefulness of its concept to define the economic aspect of product reliability, is briefly discussed