DocumentCode :
2580914
Title :
Shrinking of spin-on-glass films induced by synchrotron radiation and its application to the 3-D microfabrications
Author :
Rahman, M.M. ; Tero, R. ; Urisu, T.
Author_Institution :
Dept. of Struct. Molecular Sci., Graduate Univ. for Adv. Studies, Okazaki, Japan
fYear :
2003
fDate :
29-31 Oct. 2003
Firstpage :
254
Lastpage :
255
Abstract :
Spin-on-glass (SOG) is an important material in semiconductor integrated circuit fabrication and widely used for flattering of the inter level dielectrics. Typical thickness of SOG films are hundreds of nanometers. It is usually cured with reducing the thickness by heating to high temperatures in the last stage of the processes. In this paper, we have found that the thickness is also reduced by the irradiation of the synchroton radiation (SR) beam with covering the surface by Co mask. We are considering that this phenomenon is applied to three dimensional microfabrications, the degree of the shrinking depends on the thickness of the mask.
Keywords :
X-ray effects; etching; glass; masks; semiconductor technology; shrinkage; thin films; Co mask; shrinking; spin-on-glass films; synchrotron radiation; three dimensional microfabrications; Curing; Dielectric materials; Etching; Fabrication; Heating; Semiconductor films; Semiconductor materials; Strontium; Synchrotron radiation; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microprocesses and Nanotechnology Conference, 2003. Digest of Papers. 2003 International
Conference_Location :
Tokyo, Japan
Print_ISBN :
4-89114-040-2
Type :
conf
DOI :
10.1109/IMNC.2003.1268742
Filename :
1268742
Link To Document :
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