• DocumentCode
    2580916
  • Title

    Integrity risk of cycle resolution in the presence of bounded faults

  • Author

    Khanafseh, Samer ; Joerger, Mathieu ; Pervan, Boris

  • Author_Institution
    Illinois Inst. of Technol., Chicago, IL, USA
  • fYear
    2012
  • fDate
    23-26 April 2012
  • Firstpage
    664
  • Lastpage
    672
  • Abstract
    This paper introduces a method to compute an upper bound on the integrity risk of cycle resolution in the presence of bounded measurement errors and faults. In high accuracy applications such as shipboard landing and autonomous airborne refueling, carrier phase cycle ambiguities must be estimated and resolved as integers (or `fixed ambiguities´). In applications that also demand high integrity, the cycle resolution process must comply with a fault-free integrity risk requirement. Under normal error conditions, fault-free integrity risk can readily be quantified using existing cycle resolution methods; this is true even in the presence of known measurement biases. However, evaluating the integrity risk of a cycle resolution process under fault hypotheses has not yet been addressed. In the case of rare-event measurement faults such as satellite failures and atmospheric anomalies, the magnitude of the fault is never exactly known, but it can often be bounded. The bound can either be a result of a monitor´s minimum detectable error, from extensive data analysis, or even from physical limitation. In this paper, we develop a method to account for these bounded errors in the computation of the integrity risk for navigation systems that rely on fixed carrier phase cycle ambiguities.
  • Keywords
    measurement errors; position measurement; radionavigation; bounded measurement errors; bounded measurement faults; cycle resolution process; fault-free integrity risk requirement; fixed carrier phase cycle ambiguities; normal error conditions; rare-event measurement faults; Atmospheric measurements; Measurement uncertainty; Vectors; Bounded faults; Cycle Resolution; Integrity Risk;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Position Location and Navigation Symposium (PLANS), 2012 IEEE/ION
  • Conference_Location
    Myrtle Beach, SC
  • ISSN
    2153-358X
  • Print_ISBN
    978-1-4673-0385-9
  • Type

    conf

  • DOI
    10.1109/PLANS.2012.6236941
  • Filename
    6236941