DocumentCode
2580916
Title
Integrity risk of cycle resolution in the presence of bounded faults
Author
Khanafseh, Samer ; Joerger, Mathieu ; Pervan, Boris
Author_Institution
Illinois Inst. of Technol., Chicago, IL, USA
fYear
2012
fDate
23-26 April 2012
Firstpage
664
Lastpage
672
Abstract
This paper introduces a method to compute an upper bound on the integrity risk of cycle resolution in the presence of bounded measurement errors and faults. In high accuracy applications such as shipboard landing and autonomous airborne refueling, carrier phase cycle ambiguities must be estimated and resolved as integers (or `fixed ambiguities´). In applications that also demand high integrity, the cycle resolution process must comply with a fault-free integrity risk requirement. Under normal error conditions, fault-free integrity risk can readily be quantified using existing cycle resolution methods; this is true even in the presence of known measurement biases. However, evaluating the integrity risk of a cycle resolution process under fault hypotheses has not yet been addressed. In the case of rare-event measurement faults such as satellite failures and atmospheric anomalies, the magnitude of the fault is never exactly known, but it can often be bounded. The bound can either be a result of a monitor´s minimum detectable error, from extensive data analysis, or even from physical limitation. In this paper, we develop a method to account for these bounded errors in the computation of the integrity risk for navigation systems that rely on fixed carrier phase cycle ambiguities.
Keywords
measurement errors; position measurement; radionavigation; bounded measurement errors; bounded measurement faults; cycle resolution process; fault-free integrity risk requirement; fixed carrier phase cycle ambiguities; normal error conditions; rare-event measurement faults; Atmospheric measurements; Measurement uncertainty; Vectors; Bounded faults; Cycle Resolution; Integrity Risk;
fLanguage
English
Publisher
ieee
Conference_Titel
Position Location and Navigation Symposium (PLANS), 2012 IEEE/ION
Conference_Location
Myrtle Beach, SC
ISSN
2153-358X
Print_ISBN
978-1-4673-0385-9
Type
conf
DOI
10.1109/PLANS.2012.6236941
Filename
6236941
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