DocumentCode :
2581046
Title :
Studies on the mechanism of high resolution and high aspect ratio in DFVP
Author :
Tingting Wen ; Bin Zhang ; Peiqing Wang
Author_Institution :
Tsinghua Univ., Beijing, China
fYear :
2003
fDate :
29-31 Oct. 2003
Firstpage :
270
Abstract :
Summary form only given. Development-free vapor photolithography (DFVP) is a unique all-dry pattern transfer technique with many advantages such as superior quality, high aspect ratio and high resolution. This paper analyzes the mechanism of the DFVP and proposes a theory model to explain the cause of its advantages. In this paper we study the effects of several polymers upon the development free vapor photolithography. Research shows that functional groups of polymers, glass transition temperature (Tg), film thickness, and etching temperature all have effects on the reaction. Experiments are designed and carried out, the result shows the polymer is the main factor affecting the resolution and aspect ratio of the pattern.
Keywords :
etching; glass transition; photolithography; polymer films; development-free vapor photolithography; dry pattern transfer technique; etching temperature; film thickness; glass transition temperature; high aspect ratio; polymers; superior quality; Cities and towns; Etching; Glass; Lithography; Polymer films; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microprocesses and Nanotechnology Conference, 2003. Digest of Papers. 2003 International
Conference_Location :
Tokyo, Japan
Print_ISBN :
4-89114-040-2
Type :
conf
DOI :
10.1109/IMNC.2003.1268750
Filename :
1268750
Link To Document :
بازگشت