Title :
Design and synthesis of built-in self-testable two-dimensional discrete cosine transform circuits
Author :
Kim, Han Bin ; Ha, Dong Sam
Author_Institution :
Sun Microsyst. Inc., Palo Alto, CA, USA
Abstract :
We present design of a two-dimensional (2-D) discrete cosine transform (DCT) circuit with built-in self-test (BIST) capability. After modifying an existing fast 2-D DCT algorithm to make it more flexible, we synthesized the data path and the controller using our high-level BIST synthesis tool and incorporated scan design in other modules. Our design achieves high fault coverage at small cost of area overhead and system performance degradation
Keywords :
automatic test pattern generation; boundary scan testing; built-in self test; data compression; discrete cosine transforms; fault diagnosis; high level synthesis; image coding; image processing equipment; BIST; area overhead; built-in self-testable circuits; data path; fault coverage; high-level BIST synthesis tool; scan design; system performance degradation; two-dimensional discrete cosine transform; Algorithm design and analysis; Built-in self-test; Circuit faults; Circuit synthesis; Control system synthesis; Costs; Degradation; Discrete cosine transforms; System performance; Two dimensional displays;
Conference_Titel :
ASIC/SOC Conference, 2000. Proceedings. 13th Annual IEEE International
Conference_Location :
Arlington, VA
Print_ISBN :
0-7803-6598-4
DOI :
10.1109/ASIC.2000.880666
