• DocumentCode
    2581399
  • Title

    Experimental setup for measuring the local temperature of active electronic components

  • Author

    Dhokkar, Sonia ; Lagonotte, Patrick ; Blondel, Gael ; Masson, Philippe ; Matt, Jean-claude ; Piteau, Andre

  • fYear
    2007
  • fDate
    2-5 Sept. 2007
  • Firstpage
    1
  • Lastpage
    10
  • Abstract
    A novel non-destructive and non-contacting technique for the local temperature measurement of heat spot in electronic component is presented. Highly-sensitive lock-in near infrared (NIR) thermography is used to localize the heat spot induced temperature variations down to 10-1°C at a lateral resolution down to 3 μm. Speedy temperature evolution about 10 microseconds can be followed as using an integral InGaAs PIN photodiode assembled with the matched preamplifier.
  • Keywords
    Calibration; Electronic components; Infrared heating; Microelectronics; Optical microscopy; Probes; Radiometry; Spatial resolution; Steady-state; Temperature measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Electronics and Applications, 2007 European Conference on
  • Conference_Location
    Aalborg, Denmark
  • Print_ISBN
    978-92-75815-10-8
  • Electronic_ISBN
    978-92-75815-10-8
  • Type

    conf

  • DOI
    10.1109/EPE.2007.4417384
  • Filename
    4417384
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2581399