DocumentCode
2581888
Title
PCA vs. automatically pruned wavelet-packet PCA for illumination tolerant face recognition
Author
Bhagavatula, Ramamurthy ; Savvides, Marios
Author_Institution
Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA
fYear
2005
fDate
17-18 Oct. 2005
Firstpage
69
Lastpage
74
Abstract
Facial recognition/verification R. Chellappa et al., (1995), is a continuing and growing area of research in the field of biometrics. One of the first approaches to this challenge was principal component analysis (PCA) [M. A. Turk et al., (1991), T. Chen et al., (2002)]. Typically PCA is performed in the original spatial domain. However, PCA has a high sensitivity to illumination effects in the original spatial domain. We propose that by using wavelet packet decomposition M. Vetterli et al., (1995), to create localized space-frequency subspaces of the original data, we can perform PCA in these subspaces which can generalize better across illumination variations. We report results on the CMU PIE database T. Sim et al., (2003), by comparing reconstruction error in the original spatial domain to that of the reconstruction error in the spatial subspaces (keeping same number of eigenvectors). It is seen that the total reconstruction error of the space-frequency subspaces is smaller than that of the original space and the automatically pruned wavelet packet PCA produced better face recognition performance across illumination.
Keywords
biometrics (access control); face recognition; image reconstruction; principal component analysis; wavelet transforms; CMU PIE database; automatically pruned PCA; biometrics field; facial recognition-verification; illumination tolerance; principal component analysis; reconstruction error; space-frequency subspace; spatial domain analysis; wavelet-packet decomposition; Biometrics; Covariance matrix; Face recognition; Frequency; Image reconstruction; Karhunen-Loeve transforms; Lighting; Principal component analysis; Training data; Wavelet packets;
fLanguage
English
Publisher
ieee
Conference_Titel
Automatic Identification Advanced Technologies, 2005. Fourth IEEE Workshop on
Print_ISBN
0-7695-2475-3
Type
conf
DOI
10.1109/AUTOID.2005.38
Filename
1544403
Link To Document