• DocumentCode
    2582413
  • Title

    Ultimate performances of oscillators in time domain

  • Author

    Groslambert, J.

  • Author_Institution
    Lab. de Phys. et Metrol. des Oscillateurs, CNRS, Besancon, France
  • fYear
    1996
  • fDate
    5-7 Jun 1996
  • Firstpage
    897
  • Lastpage
    903
  • Abstract
    Assuming a noise free resonator the ultimate performances of an oscillator in time domain can be calculated. It shall be demonstrated that the ultimate time flicker level of an oscillator is only limited by two factors: the loaded Q of the resonator and the flicker noise level at 1 Hz of the amplifier phase noise. A chart can be drawn relating the three quantities σy(τ), Qloaded and Lampli(1 Hz). It is possible to see immediately that to obtain for example in time domain a flicker level of 5×10-14 using a resonator which exhibits a loaded Q coefficient of 6.5×105 we must use an amplifier with a flicker phase noise as low as Lamp (1 Hz)=-148 dBc/Hz. This performance level is hard to find in current amplifiers. Thus, it is of utmost importance to measure precisely the contributions of the amplifier to the noise in the oscillator loop. We introduce new system based on the injection principle giving an improvement of thirty dB versus the homodyne method and permitting measurements at -165 dB at 1 Hz for flicker noise and -190 dB for thermal noise. The advantages and ultimate performances of this new measurement system are described
  • Keywords
    1/f noise; Q-factor; circuit noise; circuit testing; electric noise measurement; flicker noise; oscillators; phase noise; thermal noise; time-domain analysis; amplifier phase noise; flicker phase noise; injection principle; measurement system; oscillators; resonator loaded Q; thermal noise; time domain performance; time flicker level; 1f noise; Current measurement; Fluctuations; Frequency; Laboratories; Noise level; Noise measurement; Oscillators; Phase measurement; Phase noise;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Frequency Control Symposium, 1996. 50th., Proceedings of the 1996 IEEE International.
  • Conference_Location
    Honolulu, HI
  • Print_ISBN
    0-7803-3309-8
  • Type

    conf

  • DOI
    10.1109/FREQ.1996.560273
  • Filename
    560273