Title :
On the detectability of parametric faults in analog circuits
Author :
Savir, Jacob ; Guo, Zhen
Author_Institution :
Dept. of Electr. & Comput. Eng., New Jersey Inst. of Technol., Newark, NJ, USA
Abstract :
This paper investigates the detectability of parameter faults in linear, time-invariant, analog circuits. We show that there are inherent limitations with regard to analog fault detectability.
Keywords :
analogue circuits; circuit testing; fault diagnosis; linear network analysis; linear time-invariant analog circuits; parametric fault detectability; Analog circuits; Circuit faults; Circuit testing; Electrical fault detection; Fault detection; Jacobian matrices; Performance evaluation; Pins; Space technology; Transfer functions;
Conference_Titel :
Computer Design: VLSI in Computers and Processors, 2002. Proceedings. 2002 IEEE International Conference on
Print_ISBN :
0-7695-1700-5
DOI :
10.1109/ICCD.2002.1106781
