Title :
Applying decay strategies to branch predictors for leakage energy savings
Author :
Hu, Zhigang ; Juang, P. ; Skadron, Kevin ; Clark, Douglas ; Martonosi, Margaret
Author_Institution :
Dept. of Electr. Eng., Princeton Univ., NJ, USA
Abstract :
With technology advancing toward deep submicron, leakage energy is of increasing concern, especially for large onchip array structures such as caches and branch predictors. Recent work has suggested that even larger branch predictors can and should be used in order to improve microprocessor performance. A further consideration is that the branch predictor is a thermal hot spot, thus further increasing its leakage. For these reasons, it is natural to consider applying decay techniques-already shown to reduce leakage energy for caches-to branch-prediction structures. Due to the structural difference between caches and branch predictors, applying decay techniques to branch predictors is not straightforward. This paper explores the strategies for exploiting spatial and temporal locality to make decay effective for bimodal, gshare, and hybrid predictors, as well as the branch target buffer Overall, this paper demonstrates that decay techniques apply more broadly than just to caches, but that careful policy and implementation make the difference between success and failure in building decay-based branch predictors. Multi-component hybrid predictors offer especially interesting implementation tradeoffs for decay.
Keywords :
computer architecture; electrical faults; low-power electronics; microprocessor chips; performance evaluation; virtual machines; bimodal predictors; branch predictors; branch target buffer; caches; decay techniques; gshare predictors; hybrid predictors; large on-chip array structures; leakage energy savings; microprocessor performance; multi-component hybrid predictors; spatial locality; temporal locality; thermal hot spot; Circuits; Clocks; Energy management; Fabrication; Load forecasting; Microprocessors; Power dissipation; Power generation; Technology forecasting; Threshold voltage;
Conference_Titel :
Computer Design: VLSI in Computers and Processors, 2002. Proceedings. 2002 IEEE International Conference on
Print_ISBN :
0-7695-1700-5
DOI :
10.1109/ICCD.2002.1106809