DocumentCode :
2583225
Title :
Performance modeling of analog integrated circuits using least-squares support vector machines
Author :
Kiely, Tholom ; Gielen, Georges
Author_Institution :
Dept. of Electr. Eng., Katholieke Universiteit, Leuven, Belgium
Volume :
1
fYear :
2004
fDate :
16-20 Feb. 2004
Firstpage :
448
Abstract :
This paper describes the application of least-squares support vector machine (LS-SVM) training to analog circuit performance modeling as needed for accelerated or hierarchical analog circuit synthesis. The training is a type of regression, where a function of a special form is fit to experimental performance data derived from analog circuit simulations. The method is contrasted with a feasibility model approach based on the more traditional use of SVMs, namely classification. A design of experiments (DOE) strategy is reviewed which forms the basis of an efficient simulation sampling scheme. The results of our functional regression are then compared to two other DOE-based fitting schemes: a simple linear least-squares regression and a regression using posynomial models. The LS-SVM fitting has advantages over these approaches in terms of accuracy of fit to measured data, prediction of intermediate data points and reduction of free model tuning parameters.
Keywords :
analogue integrated circuits; design of experiments; least squares approximations; performance evaluation; regression analysis; reliability; simulation; support vector machines; DOE-based fitting schemes; analog circuit simulations; analog integrated circuits; data points; design of experiments strategy; experimental performance data; free model tuning parameters; functional regression; hierarchical analog circuit synthesis; least-squares support vector machines; linear least-squares regression; performance modelling; posynomial models; prediction; simulation sampling scheme; Acceleration; Analog circuits; Analog integrated circuits; Circuit simulation; Integrated circuit modeling; Integrated circuit synthesis; Predictive models; Sampling methods; Support vector machines; US Department of Energy;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design, Automation and Test in Europe Conference and Exhibition, 2004. Proceedings
ISSN :
1530-1591
Print_ISBN :
0-7695-2085-5
Type :
conf
DOI :
10.1109/DATE.2004.1268887
Filename :
1268887
Link To Document :
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