Distribution, remote control and measurement of frequency stable, low phase noise standard signals

Author

Peters, H.E. ; Owings, H.B. ; MacMillan, C.C. ; Oakley, W. ; Smith, L.R.

Author_Institution

Sigma Tau Stand. Corp., Tuscaloosa, AL, USA

fYear

1996

fDate

5-7 Jun 1996

Firstpage

964

Lastpage

972

Abstract

Research, development and application of two unique instruments providing improved solutions to the problems encountered in the distribution, remote control and measurement of frequency stable, low phase noise standard signals are described. One of these is an Auxiliary Output Generator (AOG) providing remotely and locally controllable variation of frequency and phase with unprecedented resolution and low noise using a 5 MHz reference standard. The AOG provides the function of a continuously variable phase or frequency shifter as well as a synchronizable one pulse per second output. The second instrument is a Time Domain Measurement System (TDMS) including an internal offset generator so that stability, frequency and phase measurements can be made with exceptional precision without changing the frequency or phase of the source. Design concepts and applications of these instruments are described and measurement sensitivities are presented in conjunction with stability curves illustrating the performance of Sigma Tau Standards Corporation atomic hydrogen masers

Keywords

frequency measurement; frequency stability; measurement standards; phase measurement; phase noise; signal generators; 5 MHz; Auxiliary Output Generator; Time Domain Measurement System; atomic hydrogen maser; distribution; frequency measurement; frequency stability; phase measurement; phase noise; remote control; standard signal; Atomic measurements; Frequency measurement; Instruments; Measurement standards; Noise measurement; Phase measurement; Phase noise; Signal resolution; Stability; Standards development;

fLanguage

English

Publisher

ieee

Conference_Titel

Frequency Control Symposium, 1996. 50th., Proceedings of the 1996 IEEE International.

Conference_Location

Honolulu, HI

Print_ISBN

0-7803-3309-8

Type

conf

DOI

10.1109/FREQ.1996.560282

Filename

560282