• DocumentCode
    2583425
  • Title

    Environmental effects in frequency synthesizers for passive frequency standards

  • Author

    Nava, J. F Garcia ; Walls, F.L. ; Shirley, J.H. ; Lee, W.D. ; Aramburo, M. C Delgado

  • Author_Institution
    Centro Nacional de Metrologia, Queretaro, Mexico
  • fYear
    1996
  • fDate
    5-7 Jun 1996
  • Firstpage
    973
  • Lastpage
    979
  • Abstract
    This paper reviews the environmental effects in synthesizers designed to support a frequency stability of 10-13 τ-1/2 in short term and 10-17 in the long term. Specifically we consider the effects of temperature, pulling by spurious spectral lines, vibration effects, and pickup of spurious rf signals. We show that the temperature coefficient of the new NIST HR1 synthesizers is less than 1 ps/K and that the pulling from spectral purity is less than 3×10-20 in NIST-7, our primary thermal cesium beam standard. The pulling for slow cesium standards should be lower. We also show that the pulling due to spurious lines in Ramsey standards with narrow line widths can be manipulated to examine spectral pulling. The fractional frequency stability is better than 3×10-14 τ-1/2 for measurement times out to 104 s and reaches 10-16 in about 15 minutes in a standard laboratory environment of roughly +/-0.5 K without the need of additional thermal regulation
  • Keywords
    frequency measurement; frequency stability; frequency synthesizers; measurement standards; NIST HR1; NIST-7; RF signal; Ramsey standard; environmental effect; frequency stability; frequency synthesizer; passive frequency standard; spectral pulling; temperature coefficient; thermal cesium beam standard; vibration; 1f noise; Atomic measurements; Frequency measurement; Frequency synthesizers; Measurement standards; NIST; Noise level; Temperature; Thermal stability; Working environment noise;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Frequency Control Symposium, 1996. 50th., Proceedings of the 1996 IEEE International.
  • Conference_Location
    Honolulu, HI
  • Print_ISBN
    0-7803-3309-8
  • Type

    conf

  • DOI
    10.1109/FREQ.1996.560283
  • Filename
    560283