• DocumentCode
    2583667
  • Title

    Characterization and modeling of silicon carbide power devices and paralleling operation

  • Author

    Cui, Yutian ; Chinthavali, Madhu S. ; Xu, Fan ; Tolbert, Leon M.

  • Author_Institution
    Univ. of Tennessee, Knoxville, TN, USA
  • fYear
    2012
  • fDate
    28-31 May 2012
  • Firstpage
    228
  • Lastpage
    233
  • Abstract
    This paper presents recent research on several silicon carbide (SiC) power devices. The devices have been tested for both static and dynamic characteristics, which show the advantages over their Si counterparts. The temperature dependency of these characteristics has also been presented in this paper. Then, simulation work of paralleling operation of SiC power MOSFETs based on a verified device model in Pspice is presented to show the impact of parasitics in the circuit on the switching performance.
  • Keywords
    SPICE; power MOSFET; silicon compounds; PSPICE; SiC; SiC power MOSFET; modeling; paralleling operation; parasitics; silicon carbide power devices; JFETs; Logic gates; MOSFETs; Resistance; Silicon carbide; Temperature; Transient analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Electronics (ISIE), 2012 IEEE International Symposium on
  • Conference_Location
    Hangzhou
  • ISSN
    2163-5137
  • Print_ISBN
    978-1-4673-0159-6
  • Electronic_ISBN
    2163-5137
  • Type

    conf

  • DOI
    10.1109/ISIE.2012.6237089
  • Filename
    6237089