DocumentCode
2583667
Title
Characterization and modeling of silicon carbide power devices and paralleling operation
Author
Cui, Yutian ; Chinthavali, Madhu S. ; Xu, Fan ; Tolbert, Leon M.
Author_Institution
Univ. of Tennessee, Knoxville, TN, USA
fYear
2012
fDate
28-31 May 2012
Firstpage
228
Lastpage
233
Abstract
This paper presents recent research on several silicon carbide (SiC) power devices. The devices have been tested for both static and dynamic characteristics, which show the advantages over their Si counterparts. The temperature dependency of these characteristics has also been presented in this paper. Then, simulation work of paralleling operation of SiC power MOSFETs based on a verified device model in Pspice is presented to show the impact of parasitics in the circuit on the switching performance.
Keywords
SPICE; power MOSFET; silicon compounds; PSPICE; SiC; SiC power MOSFET; modeling; paralleling operation; parasitics; silicon carbide power devices; JFETs; Logic gates; MOSFETs; Resistance; Silicon carbide; Temperature; Transient analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Industrial Electronics (ISIE), 2012 IEEE International Symposium on
Conference_Location
Hangzhou
ISSN
2163-5137
Print_ISBN
978-1-4673-0159-6
Electronic_ISBN
2163-5137
Type
conf
DOI
10.1109/ISIE.2012.6237089
Filename
6237089
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