Title :
Incorporating error detection and online reconfiguration into a regular architecture for the advanced encryption standard
Author :
Breveglieri, L. ; Koren, I. ; Maistri, P.
Author_Institution :
Dept. of Electron. & Inf. Technol., Politecnico di Milano, Italy
Abstract :
Fault injection based attacks on cryptographic devices aim at recovering the secret keys by inducing an error in the computation process. They are now considered a real threat and countermeasures against them must be taken. In this paper, we describe an extension to an existing AES architecture proposed by Mangard et al. (2003), which provides error detection and fault tolerance by exploiting the high regularity of the architecture. The proposed design is capable of performing online error detection and reconfiguring internal data paths to protect against faults occurring in the computation process. We also describe how different redundancy levels provide protection against different numbers of errors. The presented design incorporating fault detection and tolerance has the same throughput as the base architecture but incurs a nonnegligible area overhead. This overhead is about 40% for the fault detection circuitry and 134% for the entire fault detection and tolerance (through reconfiguration). Although quite high, this overhead is still lower than for reference solutions such as duplication (providing detection) and triple modular redundancy (providing fault masking).
Keywords :
cryptography; error detection; fault tolerant computing; reconfigurable architectures; redundancy; AES architecture; advanced encryption standard; cryptographic devices; fault detection circuitry; fault injection based attacks; fault masking; fault tolerance; internal data path reconfiguration; nonnegligible area overhead; online error detection; online reconfiguration; redundancy levels; triple modular redundancy; Circuit faults; Computer architecture; Computer errors; Cryptography; Electrical fault detection; Fault detection; Hardware; Protection; Redundancy; Throughput;
Conference_Titel :
Defect and Fault Tolerance in VLSI Systems, 2005. DFT 2005. 20th IEEE International Symposium on
Print_ISBN :
0-7695-2464-8
DOI :
10.1109/DFTVS.2005.41