• DocumentCode
    258381
  • Title

    Combinatorial Test Generation for Software Product Lines Using Minimum Invalid Tuples

  • Author

    Linbin Yu ; Feng Duan ; Yu Lei ; Kacker, Raghu N. ; Kuhn, D. Rick

  • Author_Institution
    Dept. of Comput. Sci. & Eng., Univ. of Texas at Arlington, Arlington, TX, USA
  • fYear
    2014
  • fDate
    9-11 Jan. 2014
  • Firstpage
    65
  • Lastpage
    72
  • Abstract
    A software product line is a set of software systems that share some common features. Several recent works have been reported that apply combinatorial testing, a very effective testing strategy, to software product lines. A unique challenge in these efforts is dealing with a potentially large number of constraints among different features. In this paper, we propose a novel constraint-handling strategy that uses minimum invalid tuples (MITs) as an alternative to traditional constraint solvers. Our approach systematically derives all MITs from a software product line, and uses them to quickly determine the validity of a test configuration during test generation. We implemented a test generation research tool called LOOKUP that integrates the proposed constraint-handling strategy with a general test generation algorithm called IPOG-C. Experimental results show that LOOKUP performs considerably better than two existing test generation tools in terms of test size and execution time.
  • Keywords
    combinatorial mathematics; constraint handling; program testing; software product lines; IPOG-C; LOOKUP test generation research tool; MITs; combinatorial test generation; constraint-handling strategy; general test generation algorithm; minimum invalid tuples; software product lines; software systems; test configuration; test size; Aircraft; Aircraft propulsion; Biological system modeling; Engines; Software systems; Testing; Combinatorial Testing; Constraint Handling; Feature Model;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    High-Assurance Systems Engineering (HASE), 2014 IEEE 15th International Symposium on
  • Conference_Location
    Miami Beach, FL
  • Print_ISBN
    978-1-4799-3465-2
  • Type

    conf

  • DOI
    10.1109/HASE.2014.18
  • Filename
    6754589