DocumentCode :
2583842
Title :
Comparison of Si- and SiC-powerdiodes in 100A-modules
Author :
Bartsch, Wolfgang ; Gediga, Swen ; Koehler, Hubertus ; Sommer, Rainer ; Zaiser, Georg
Author_Institution :
SiCED Electron. Dev. GmbH & Co. KG, Nuernberg
fYear :
2007
fDate :
2-5 Sept. 2007
Firstpage :
1
Lastpage :
8
Abstract :
This paper presents the comparison of transient behaviour of 6.5 kV Si- and SiC-power diodes in 100 A-modules. The switching behaviour at a current level of 100 A is shown at DC link voltages up to 3.5 kV and at a junction temperature up to 125degC using 25 A-6.5 kV-Si-IGBTs as switching devices. Different switching conditions in chopper circuits realize different rates of current decay up to 1000 A/mus. Furthermore the switching behavior in a series connection of two SiC diodes is shown at DC link voltages up to 10.2 kV in a 3-level npc inverter phase and at a junction temperature up to 90degC. Experimental results are discussed in terms of reverse recovery currents and snappiness.
Keywords :
choppers (circuits); insulated gate bipolar transistors; power bipolar transistors; silicon compounds; wide band gap semiconductors; IGBT; SiC; bipolar device; chopper circuits; current 100 A; current 25 A; high power discrete device; insulated gate bipolar transistor; passive component; power diodes; power semiconductor device; reverse recovery currents; switching behaviour; switching conditions; switching devices; voltage 6.5 kV; Annealing; Power measurement; Power semiconductor devices; Radiative recombination; Semiconductor diodes; Silicon carbide; Temperature; Testing; Uniform resource locators; Voltage; Bipolar device; High power discrete device; Measurement; Passive component; Power semiconductor device;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Power Electronics and Applications, 2007 European Conference on
Conference_Location :
Aalborg
Print_ISBN :
978-92-75815-10-8
Electronic_ISBN :
978-92-75815-10-8
Type :
conf
DOI :
10.1109/EPE.2007.4417549
Filename :
4417549
Link To Document :
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