• DocumentCode
    2583863
  • Title

    Ultrafast warm-up rubidium reference

  • Author

    Lynch, Thomas J. ; Vaccaro, John R.

  • Author_Institution
    EG&G Frequency Products, Salem, MA, USA
  • fYear
    1996
  • fDate
    5-7 Jun 1996
  • Firstpage
    993
  • Lastpage
    1001
  • Abstract
    This paper describes the accomplishments of a program performed at EG&G to greatly reduce the warm-up time for a rubidium frequency standard (RFS) from minutes to seconds. Typical warm-up times for an RFS range from 1.5 to 10 minutes at room temperature. In some tactical situations, such warm-up times, which may be increased by low ambient temperatures, are undesirable or unacceptable, requiring for example that the RFS be turned on first when setting up a station or be kept “hot” while other equipment is off to conserve power. This program focused on the physics package. The areas that were investigated and improved related to warm-up of the absorption cell (using a design with sapphire faceplates), lighting and warm-up of the rubidium lamp, and servo acquisition and lock. In the final configuration lock was achieved in 7 seconds at +5°C. The modifications made were for engineering evaluation. Additional development is needed before a practical ultrafast warm-up rubidium reference can be produced
  • Keywords
    atomic clocks; dielectric heating; discharge lamps; frequency measurement; measurement standards; radiofrequency heating; rubidium; sapphire; servomechanisms; 5 C; 7 s; Al2O3; Rb; Rb frequency standard; Rb lamp; absorption cell; engineering evaluation; lamp heating; lighting; lock; room temperature; sapphire faceplates; servo acquisition; tactical situations; ultrafast warm-up rubidium reference; warm-up times; Absorption; Assembly; Electromagnetic heating; Electronics packaging; Frequency; Lamps; Microwave oscillators; Military standards; Physics; Resonance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Frequency Control Symposium, 1996. 50th., Proceedings of the 1996 IEEE International.
  • Conference_Location
    Honolulu, HI
  • Print_ISBN
    0-7803-3309-8
  • Type

    conf

  • DOI
    10.1109/FREQ.1996.560286
  • Filename
    560286