Modeling QCA defects at molecular-level in combinational circuits

Author

Momenzadeh, Mariam ; Ottavi, Marco ; Lombardi, Fabrizio

Author_Institution

Dept. of Electr. & Comput. Eng., Northeastern Univ., Boston, MA, USA

fYear

2005

fDate

3-5 Oct. 2005

Firstpage

208

Lastpage

216

Abstract

This paper analyzes the deposition defects in devices and circuits made of quantum-dot cellular automata (QCA) for molecular implementation. Differently from metal-based QCA, in this type of implementation a defect may occur due to the erroneous deposition of cells (made of molecules) on a substrate, i.e. no cell, or an additional cell is placed either near, or within the layout configuration of a QCA device. The effects of an erroneous cell deposition defect are analyzed by considering the induced functional faults for different QCA devices, such as the majority voter, the inverter and various wire configurations (straight, L-shape, coplanar crossing and fanout). Extensive simulation results are provided. As an example, testing of an EXOR circuit is analyzed in detail.

Keywords

cellular automata; combinational circuits; fault diagnosis; fault tolerance; logic testing; molecular electronics; quantum dots; sequential circuits; QCA defect modeling; QCA device layout configuration; combinational circuits; erroneous cell deposition defects; quantum-dot cellular automata; CMOS logic circuits; CMOS technology; Circuit faults; Circuit simulation; Circuit testing; Combinational circuits; Integrated circuit technology; Quantum cellular automata; Quantum dots; Semiconductor device modeling; QCA; defect tolerance; emerging technology; fault model;

fLanguage

English

Publisher

ieee

Conference_Titel

Defect and Fault Tolerance in VLSI Systems, 2005. DFT 2005. 20th IEEE International Symposium on

ISSN

1550-5774

Print_ISBN

0-7695-2464-8

Type

conf

DOI

10.1109/DFTVS.2005.46

Filename

1544519