Title :
Modeling QCA defects at molecular-level in combinational circuits
Author :
Momenzadeh, Mariam ; Ottavi, Marco ; Lombardi, Fabrizio
Author_Institution :
Dept. of Electr. & Comput. Eng., Northeastern Univ., Boston, MA, USA
Abstract :
This paper analyzes the deposition defects in devices and circuits made of quantum-dot cellular automata (QCA) for molecular implementation. Differently from metal-based QCA, in this type of implementation a defect may occur due to the erroneous deposition of cells (made of molecules) on a substrate, i.e. no cell, or an additional cell is placed either near, or within the layout configuration of a QCA device. The effects of an erroneous cell deposition defect are analyzed by considering the induced functional faults for different QCA devices, such as the majority voter, the inverter and various wire configurations (straight, L-shape, coplanar crossing and fanout). Extensive simulation results are provided. As an example, testing of an EXOR circuit is analyzed in detail.
Keywords :
cellular automata; combinational circuits; fault diagnosis; fault tolerance; logic testing; molecular electronics; quantum dots; sequential circuits; QCA defect modeling; QCA device layout configuration; combinational circuits; erroneous cell deposition defects; quantum-dot cellular automata; CMOS logic circuits; CMOS technology; Circuit faults; Circuit simulation; Circuit testing; Combinational circuits; Integrated circuit technology; Quantum cellular automata; Quantum dots; Semiconductor device modeling; QCA; defect tolerance; emerging technology; fault model;
Conference_Titel :
Defect and Fault Tolerance in VLSI Systems, 2005. DFT 2005. 20th IEEE International Symposium on
Print_ISBN :
0-7695-2464-8
DOI :
10.1109/DFTVS.2005.46
