2583949

A Highly Reliable 0.35/spl mu/m Field-shield Body-tied SOI Gate Array For Substrate-bias-effect Free Operation

Maeda, S. ; Yamaguchi, Y. ; Kim, I.-J. ; Iwamatsu, T. ; Ipposhi, T. ; Miyamoto, S. ; Hirano, Y. ; Ueda, K. ; Nii, K. ; Mashiko, K. ; Maegawa, S. ; Inoue, Y. ; Nishimura, T.

Mitsubishi Electric Corporation, 4-l Mizuhara, Itami, Hyogo 664, Japan

1997

10-12 June 1997

93

94

English

ieee

VLSI Technology, 1997. Digest of Technical Papers., 1997 Symposium on

4-930813-75-1

conf

10.1109/VLSIT.1997.623711

623711