• DocumentCode
    2583987
  • Title

    Influence of commutation delay and tube voltage drop on waveform distortion and its compensation in matrix converter

  • Author

    Cai, Wei ; Zhang, Xiaofeng ; Qiao, Mingzhong ; He, Bi

  • Author_Institution
    Coll. of Electr. & Inf. Eng., Naval Univ. of Eng., Wuhan, China
  • fYear
    2012
  • fDate
    28-31 May 2012
  • Firstpage
    354
  • Lastpage
    359
  • Abstract
    The output waveform distorts seriously at low modulation ratio, and there are not a paper analyze it overall yet. This paper gives a research on the problem from some facts, the narrow pulse, the commutation delay and tube voltage drop. The time of commutation delay varies as the direction of output current changes, equivalent to the addition or reduction of the vectors´ operation time, influencing the waveform distortion all the time. The tube voltage drop is constant generally. Its proportion of output voltage is so little that it can be ignored at high modulation ratio, while the condition inverse at low modulation ratio. Against two elements causing the distortion, this paper presents corresponding compensation method. The direct time compensation method is used for the waveform distorted by commutation delay and the feedforward compensation method is used for the tube voltage drop at very low modulation ratio. The experimental results verify the proposed method.
  • Keywords
    commutation; compensation; delays; distortion; electric potential; feedforward; matrix convertors; commutation delay; condition inverse; direct time compensation method; feedforward compensation method; high modulation ratio; low modulation ratio; matrix converter; output current changes; output waveform distortion; tube voltage drop; vectors operation time; very low modulation ratio; waveform distortion; Delay; Electron tubes; Feedforward neural networks; Phase modulation; Support vector machines; Vectors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Electronics (ISIE), 2012 IEEE International Symposium on
  • Conference_Location
    Hangzhou
  • ISSN
    2163-5137
  • Print_ISBN
    978-1-4673-0159-6
  • Electronic_ISBN
    2163-5137
  • Type

    conf

  • DOI
    10.1109/ISIE.2012.6237111
  • Filename
    6237111