Title :
Verifying (k, 0, d)-extendability in bipartite graphs and its application
Author_Institution :
Sch. of Econ. & Manage., South China Normal Univ., Guangzhou, China
Abstract :
A defect d-matching in a graph G is a matching covering all but d vertices in G. Let G = (U, W) be a bipartite graph with bipartition U, W and |W|≥|U|. Let k, d be non-negative integers such that k + d = |W| ≥-|U|. If deleting any k vertices from W, the remaining subgraph of G contains a defect d-matching, then G is said to be (k, 0, d)-extendable. (k, 0, d)-extendable bipartite graphs find applications in designing the robust job assignment circuit. In this paper, we investigate the properties and characterizations of (k, 0, d)-extendable bipartite graphs. Basing on these results, an efficient algorithm to determine the (k, 0, d)-extendability of a bipartite graph is designed and we also prove that the time complexity of the algorithm is much better than that of the algorithm designed basing on the definition.
Keywords :
computational complexity; graph theory; bipartite graphs; time complexity; Algorithm design and analysis; Bipartite graph; Flexible printed circuits; Job design; Joining processes; Robustness; (k, 0, d)-extendable; A defect d-matching; Job assignment circuit;
Conference_Titel :
Electronic Computer Technology (ICECT), 2010 International Conference on
Conference_Location :
Kuala Lumpur
Print_ISBN :
978-1-4244-7404-2
Electronic_ISBN :
978-1-4244-7406-6
DOI :
10.1109/ICECTECH.2010.5479976