DocumentCode
2584004
Title
Verifying (k, 0, d)-extendability in bipartite graphs and its application
Author
Wen, Xuelian
Author_Institution
Sch. of Econ. & Manage., South China Normal Univ., Guangzhou, China
fYear
2010
fDate
7-10 May 2010
Firstpage
117
Lastpage
121
Abstract
A defect d-matching in a graph G is a matching covering all but d vertices in G. Let G = (U, W) be a bipartite graph with bipartition U, W and |W|≥|U|. Let k, d be non-negative integers such that k + d = |W| ≥-|U|. If deleting any k vertices from W, the remaining subgraph of G contains a defect d-matching, then G is said to be (k, 0, d)-extendable. (k, 0, d)-extendable bipartite graphs find applications in designing the robust job assignment circuit. In this paper, we investigate the properties and characterizations of (k, 0, d)-extendable bipartite graphs. Basing on these results, an efficient algorithm to determine the (k, 0, d)-extendability of a bipartite graph is designed and we also prove that the time complexity of the algorithm is much better than that of the algorithm designed basing on the definition.
Keywords
computational complexity; graph theory; bipartite graphs; time complexity; Algorithm design and analysis; Bipartite graph; Flexible printed circuits; Job design; Joining processes; Robustness; (k, 0, d)-extendable; A defect d-matching; Job assignment circuit;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Computer Technology (ICECT), 2010 International Conference on
Conference_Location
Kuala Lumpur
Print_ISBN
978-1-4244-7404-2
Electronic_ISBN
978-1-4244-7406-6
Type
conf
DOI
10.1109/ICECTECH.2010.5479976
Filename
5479976
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