DocumentCode :
2584097
Title :
Nanorobotic transfer and characterization of graphene flakes
Author :
Zimmermann, Sören ; Eichhorn, Volkmar ; Fatikow, Sergej
Author_Institution :
Technol. Cluster Automated Nanohandling (TCANH), Inst. for Inf. Technol. (OFFIS), Oldenburg, Germany
fYear :
2012
fDate :
7-12 Oct. 2012
Firstpage :
640
Lastpage :
645
Abstract :
This paper presents a nanorobotic approach facilitating the transfer and characterization of individual graphene flakes that are grown by different fabrication techniques. The approach makes use of a nanorobotic atomic force microscope system that is integrated into a high resolution scanning electron microscope and focused ion beam device. This combination is used to perform both, the nanorobotic transfer and the mechanical characterization of the graphene flake allowing to systematically analyze different sample areas and to optimize the fabrication processes. Furthermore, the nanorobotic system enables the reliable pick-and-place handling and processing of graphene flakes to realize more comprehensive analysis steps or even the prototyping of graphene-based devices.
Keywords :
atomic force microscopy; graphene; image resolution; scanning electron microscopy; comprehensive analysis; fabrication processes; fabrication techniques; graphene flakes; graphene-based devices; high resolution scanning electron microscope; ion beam device; mechanical characterization; nanorobotic atomic force microscope system; nanorobotic system; nanorobotic transfer; pick-and-place handling; Ion beams; Probes; Scanning electron microscopy; Substrates; Tungsten;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Intelligent Robots and Systems (IROS), 2012 IEEE/RSJ International Conference on
Conference_Location :
Vilamoura
ISSN :
2153-0858
Print_ISBN :
978-1-4673-1737-5
Type :
conf
DOI :
10.1109/IROS.2012.6385474
Filename :
6385474
Link To Document :
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