• DocumentCode
    2584097
  • Title

    Nanorobotic transfer and characterization of graphene flakes

  • Author

    Zimmermann, Sören ; Eichhorn, Volkmar ; Fatikow, Sergej

  • Author_Institution
    Technol. Cluster Automated Nanohandling (TCANH), Inst. for Inf. Technol. (OFFIS), Oldenburg, Germany
  • fYear
    2012
  • fDate
    7-12 Oct. 2012
  • Firstpage
    640
  • Lastpage
    645
  • Abstract
    This paper presents a nanorobotic approach facilitating the transfer and characterization of individual graphene flakes that are grown by different fabrication techniques. The approach makes use of a nanorobotic atomic force microscope system that is integrated into a high resolution scanning electron microscope and focused ion beam device. This combination is used to perform both, the nanorobotic transfer and the mechanical characterization of the graphene flake allowing to systematically analyze different sample areas and to optimize the fabrication processes. Furthermore, the nanorobotic system enables the reliable pick-and-place handling and processing of graphene flakes to realize more comprehensive analysis steps or even the prototyping of graphene-based devices.
  • Keywords
    atomic force microscopy; graphene; image resolution; scanning electron microscopy; comprehensive analysis; fabrication processes; fabrication techniques; graphene flakes; graphene-based devices; high resolution scanning electron microscope; ion beam device; mechanical characterization; nanorobotic atomic force microscope system; nanorobotic system; nanorobotic transfer; pick-and-place handling; Ion beams; Probes; Scanning electron microscopy; Substrates; Tungsten;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Intelligent Robots and Systems (IROS), 2012 IEEE/RSJ International Conference on
  • Conference_Location
    Vilamoura
  • ISSN
    2153-0858
  • Print_ISBN
    978-1-4673-1737-5
  • Type

    conf

  • DOI
    10.1109/IROS.2012.6385474
  • Filename
    6385474