• DocumentCode
    2584118
  • Title

    Reliable digital circuits design using sigma-delta modulated signals

  • Author

    Schüler, Erik ; Carro, Luigi

  • Author_Institution
    Dept. de Engenharia Eletrica, Univ. Fed. do Rio Grande do Sul, Port Alegre, Brazil
  • fYear
    2005
  • fDate
    3-5 Oct. 2005
  • Firstpage
    314
  • Lastpage
    324
  • Abstract
    As the transistor gate length goes straightforward to the sub-micron dimension, the possibilities of occurrence of external interferences in these devices also increase. Moreover, the process variability further degrade this scenario. The direct effect of such external and/or intrinsic interferences is, in many cases, the total mismatch between the desired answer of the system and the achieved answer resulting from single bit flips. This way, new techniques must be studied in order to guarantee the correct operation of these systems. This work presents the use of a totally digital sigma-delta modulator that is used to develop arithmetic operations, which are further used to develop a FIR filter. Simulations results show that, even with the insertion of a large amount of faults, one can still obtain a nonfaulty behavior in the SNR of complex application.
  • Keywords
    FIR filters; digital arithmetic; fault tolerance; integrated circuit design; integrated circuit reliability; logic design; sigma-delta modulation; FIR filters; arithmetic operations; digital circuit design; digital sigma-delta modulator; external interferences; intrinsic interferences; process variability; sigma-delta modulated signals; transistor gate length; Circuit faults; Delta-sigma modulation; Digital circuits; Digital modulation; Electromagnetic transients; Finite impulse response filter; Interference; MOSFETs; Signal design; Single event upset;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Defect and Fault Tolerance in VLSI Systems, 2005. DFT 2005. 20th IEEE International Symposium on
  • ISSN
    1550-5774
  • Print_ISBN
    0-7695-2464-8
  • Type

    conf

  • DOI
    10.1109/DFTVS.2005.57
  • Filename
    1544530