Title :
Implementation of concurrent checking circuits by independent sub-circuits
Author :
Ostrovsky, Vladimir ; Levin, Ilya
Author_Institution :
Sch. of Eng., Bar-Ilan Univ., Ramat Gan, Israel
Abstract :
The present paper proposes a new method for detecting arbitrary faults in a functional circuit when the set of codewords is limited and known in advance. The method is based on implementation of the functional circuit by a plurality of separate independent sub-circuits. Each of such sub-circuits generates its own subset of output signals. Since the sub-circuits do not have common elements, any single fault may result in errors only in one of the subsets. The paper presents a solution of the problem of optimal partition of the set of output variables into independent subsets. A number of properties of partitions are proven. The proposed algorithms of the optimal partition are based on these properties. A scheme of the checker for the proposed self-checking approach is presented. Benchmarks´ results indicate efficiency of the described technique.
Keywords :
automatic testing; built-in self test; fault diagnosis; logic partitioning; logic testing; arbitrary fault detection; concurrent checking circuits; functional circuit; independent sub-circuits; optimal partitioning; self-checking approach; Circuit faults; Combinational circuits; Electrical fault detection; Fault detection; Gallium nitride; Hardware; Inverters; Logic functions; Partitioning algorithms; Signal generators;
Conference_Titel :
Defect and Fault Tolerance in VLSI Systems, 2005. DFT 2005. 20th IEEE International Symposium on
Print_ISBN :
0-7695-2464-8
DOI :
10.1109/DFTVS.2005.39