• DocumentCode
    2584390
  • Title

    Recovery during concurrent on-line testing of identical circuits

  • Author

    Pomeranz, Irith ; Reddy, Sudhakar M.

  • Author_Institution
    Sch. of Electr. & Comput. Eng., Purdue Univ., W. Lafayette, IN, USA
  • fYear
    2005
  • fDate
    3-5 Oct. 2005
  • Firstpage
    475
  • Lastpage
    483
  • Abstract
    We show that a concurrent online testing scheme based on output comparison of identical circuits can also identify situations where the circuit recovers from a permanent fault, i.e., functional operation can continue temporarily in spite of the presence of a fault. We show that the ability to recover from a fault is circuit-dependent, and that some circuits are better than others at allowing recovery. We also discuss the possibility of false recovery in the presence of multiple faults and its implications.
  • Keywords
    fault tolerance; integrated circuit reliability; integrated circuit testing; circuit recovery; concurrent online testing; identical circuit testing; permanent fault recovery; Aging; Circuit faults; Circuit testing; Cities and towns; Design methodology; Electrical fault detection; Fault detection; Fault diagnosis; Microprocessors; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Defect and Fault Tolerance in VLSI Systems, 2005. DFT 2005. 20th IEEE International Symposium on
  • ISSN
    1550-5774
  • Print_ISBN
    0-7695-2464-8
  • Type

    conf

  • DOI
    10.1109/DFTVS.2005.56
  • Filename
    1544547