DocumentCode
2584390
Title
Recovery during concurrent on-line testing of identical circuits
Author
Pomeranz, Irith ; Reddy, Sudhakar M.
Author_Institution
Sch. of Electr. & Comput. Eng., Purdue Univ., W. Lafayette, IN, USA
fYear
2005
fDate
3-5 Oct. 2005
Firstpage
475
Lastpage
483
Abstract
We show that a concurrent online testing scheme based on output comparison of identical circuits can also identify situations where the circuit recovers from a permanent fault, i.e., functional operation can continue temporarily in spite of the presence of a fault. We show that the ability to recover from a fault is circuit-dependent, and that some circuits are better than others at allowing recovery. We also discuss the possibility of false recovery in the presence of multiple faults and its implications.
Keywords
fault tolerance; integrated circuit reliability; integrated circuit testing; circuit recovery; concurrent online testing; identical circuit testing; permanent fault recovery; Aging; Circuit faults; Circuit testing; Cities and towns; Design methodology; Electrical fault detection; Fault detection; Fault diagnosis; Microprocessors; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Defect and Fault Tolerance in VLSI Systems, 2005. DFT 2005. 20th IEEE International Symposium on
ISSN
1550-5774
Print_ISBN
0-7695-2464-8
Type
conf
DOI
10.1109/DFTVS.2005.56
Filename
1544547
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