Title :
Recovery during concurrent on-line testing of identical circuits
Author :
Pomeranz, Irith ; Reddy, Sudhakar M.
Author_Institution :
Sch. of Electr. & Comput. Eng., Purdue Univ., W. Lafayette, IN, USA
Abstract :
We show that a concurrent online testing scheme based on output comparison of identical circuits can also identify situations where the circuit recovers from a permanent fault, i.e., functional operation can continue temporarily in spite of the presence of a fault. We show that the ability to recover from a fault is circuit-dependent, and that some circuits are better than others at allowing recovery. We also discuss the possibility of false recovery in the presence of multiple faults and its implications.
Keywords :
fault tolerance; integrated circuit reliability; integrated circuit testing; circuit recovery; concurrent online testing; identical circuit testing; permanent fault recovery; Aging; Circuit faults; Circuit testing; Cities and towns; Design methodology; Electrical fault detection; Fault detection; Fault diagnosis; Microprocessors; System testing;
Conference_Titel :
Defect and Fault Tolerance in VLSI Systems, 2005. DFT 2005. 20th IEEE International Symposium on
Print_ISBN :
0-7695-2464-8
DOI :
10.1109/DFTVS.2005.56