Title :
A Bayesian attribute reliability growth model
Author :
Mazzuchi, Thomas A. ; Soyer, Refik
Author_Institution :
George Washington Univ., Washington, DC, USA
Abstract :
A Bayesian approach for assessment of reliability growth during the development phase of a system is presented. The authors discuss how prior information can be used to define a prior distribution for the failure probabilities at each state of testing. They illustrate the use of their approach by applying it to some failure data
Keywords :
Bayes methods; failure analysis; probability; reliability; Bayesian approach; development; estimation; failure analysis; failure probabilities; reliability growth model; testing; Bayesian methods; Data analysis; Failure analysis; Performance evaluation; Reliability engineering; System performance; System testing;
Conference_Titel :
Reliability and Maintainability Symposium, 1991. Proceedings., Annual
Conference_Location :
Orlando, FL
Print_ISBN :
0-87942-661-6
DOI :
10.1109/ARMS.1991.154456
