DocumentCode :
2584711
Title :
Author index
fYear :
2005
fDate :
3-5 Oct. 2005
Firstpage :
601
Lastpage :
601
Abstract :
The author index contains an entry for each author and coauthor included in the proceedings record.
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Defect and Fault Tolerance in VLSI Systems, 2005. DFT 2005. 20th IEEE International Symposium on
Conference_Location :
Monterey, CA
ISSN :
1550-5774
Print_ISBN :
0-7695-2464-8
Type :
conf
DOI :
10.1109/DFTVS.2005.20
Filename :
1544560
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2584711