Title :
Gate Engineering For Performance And Reliability In Deep-submicron CMOS Technology
Author :
Bin Yu ; Dong-Hyuk Ju ; Kepler, N. ; Tsu-Jae King ; Chenming Hu
Author_Institution :
Dept. of EECS, University of Cafifomia, Berkeley, CA 94720, USA
Conference_Titel :
VLSI Technology, 1997. Digest of Technical Papers., 1997 Symposium on
Print_ISBN :
4-930813-75-1
DOI :
10.1109/VLSIT.1997.623717
