DocumentCode
2585031
Title
The implementation of the autonomous guided vehicle driving system for durability test
Author
Jeong, Jong Won ; Kim, Hyung Kuk ; Lee, Young Jin ; Jung, Won Wook ; Harashima, Fumio ; Lee, Man Hyung
Author_Institution
Dept. of Intelligent & Mech. Eng., Pusan Nat. Univ., South Korea
fYear
2000
fDate
2000
Firstpage
101
Lastpage
106
Abstract
Among durability tests, the accelerated durability test has been widely used to evaluate the durability of vehicle structure and chassis parts in a short period of time on the designed road which has severe surface conditions. However it increases the driver´s fatigue mainly caused by the severe driving conditions. The driver´s difficulty of maintaining constant speed reduces the reliability of test results. The durability test includes the position and distance sensing system for the recognition of the absolute and relative driving position, the driving control system for the control of whole driving circumstance, the emergency and multisafety system for responding to system errors and the camera system for monitoring driving circumstances during the test. AGVDS (Autonomous Guided Vehicle Driving System) was proved to facilitate the development of new car projects. Therefore the AGVDS we propose will help make the fundamentals for all future traffic systems
Keywords
automatic guided vehicles; computer vision; road vehicles; safety systems; testing; AGV; AGVDS; absolute driving position; accelerated durability test; autonomous guided vehicle driving system; camera system; chassis parts; distance sensing system; driving circumstance monitoring; emergency system; multisafety system; position sensing system; relative driving position; safety system; severe road surface conditions; system errors; vehicle structure; Cameras; Control systems; Error correction; Fatigue; Life estimation; Maintenance; Remotely operated vehicles; Road vehicles; System testing; Vehicle driving;
fLanguage
English
Publisher
ieee
Conference_Titel
Intelligent Transportation Systems, 2000. Proceedings. 2000 IEEE
Conference_Location
Dearborn, MI
Print_ISBN
0-7803-5971-2
Type
conf
DOI
10.1109/ITSC.2000.881025
Filename
881025
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