DocumentCode :
2585048
Title :
Computational Design and Optimisation of Mechanically Reinforced Masks for Stencil Lithography
Author :
Lishchynska, M. ; van den Boogaart, Marc A.F. ; Brugger, Juergen ; Greer, James C.
Author_Institution :
Tyndall Nat. Inst., Cork
fYear :
2007
fDate :
16-18 April 2007
Firstpage :
1
Lastpage :
7
Abstract :
Identifying, predicting and optimising stencil lithography is critical to the successful and timely development of this technique with a wide range of potential applications such as deposition on non- conventional and unstable materials (i.e. bio-chemical, hydrophobic), patterning heterostructures (epitaxial, magnetic, complex oxides, piezoelectric materials) and deposition of nanodevices onto CMOS. Previously confirmed for cantilever-like stencils is the thesis that degrading effects of stress-induced deformation of stencils can be overcome by strategic placement of corrugating structures. This approach is further exploited in this work to mechanically stabilise complex stencil designs. This involved studying the evolution of stencil deformation due to deposition induced stress and iterative design of optimal corrugation structures to be incorporated into the stencils. It is shown that degrading effects of stress-induced deformation of stencils can be significantly reduced which subsequently improves pattern definition. Reduction in deformation and in pattern distortion in the range of 50% to 96% was achieved.
Keywords :
deformation; finite element analysis; masks; nanolithography; nanopatterning; optimisation; computational design; deposition induced stress; finite element method; mechanically reinforced masks; optimisation; pattern distortion; stencil deformation; stencil lithography; stress-induced deformation; Biomembranes; Deformable models; Degradation; Design optimization; Fabrication; Lithography; Magnetic materials; Piezoelectric materials; Predictive models; Stress;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Thermal, Mechanical and Multi-Physics Simulation Experiments in Microelectronics and Micro-Systems, 2007. EuroSime 2007. International Conference on
Conference_Location :
London
Print_ISBN :
1-4244-1105-X
Electronic_ISBN :
1-4244-1106-8
Type :
conf
DOI :
10.1109/ESIME.2007.359934
Filename :
4201131
Link To Document :
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