DocumentCode :
2585167
Title :
On-Chip S-Shaped Rat-Race Balun for Millimeter-Wave Band Using Wafer-Level Chip-Size Package Process
Author :
Inui, Chiaki ; Manzawa, Yasuo ; Fujishima, Minoru
Author_Institution :
Sch. of Frontier Sci., Univ. of Tokyo, Tokyo
fYear :
2008
fDate :
27-28 Oct. 2008
Firstpage :
32
Lastpage :
35
Abstract :
In millimeter-wave CMOS circuits, a balun is useful for connecting off-chip single-end devices and on-chip differential circuits to improve noise immunity. However, an on-chip balun occupies large chip area. To reduce the chip area required for the on-chip balun, a new rat-race balun using rewiring technology with a wafer-level chip-size package (W-CSP) is proposed. The W-CSP balun occupies no area in a die because it is placed over integrated circuits. In the proposed balun, an S-shaped structure is adopted in order to directly connect the balun to differential GSGSG pads on a chip with small area. The S-shaped W-CSP balun was fabricated on a silicon-on-insulator (SOI) substrate. The core area of the S-shaped rat-race balun is 480 mum times 735 mum, which is 22.4% that of a square rat-race balun. As a result of measurement, we found that the minimum insertion loss is 1.7 dB and the operating frequency range is 40 to 61 GHz.
Keywords :
CMOS integrated circuits; MIMIC; baluns; silicon-on-insulator; wafer level packaging; SOI; insertion loss; millimeter-wave CMOS circuits; millimeter-wave band; off-chip single-end devices; on-chip S-shaped rat-race balun; on-chip differential circuits; rewiring technology; silicon-on-insulator substrate; wafer-level chip-size package; wafer-level chip-size package process; CMOS technology; Impedance matching; Integrated circuit noise; Integrated circuit packaging; Integrated circuit technology; Joining processes; Millimeter wave circuits; Millimeter wave technology; Silicon on insulator technology; Wafer scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Integrated Circuit Conference, 2008. EuMIC 2008. European
Conference_Location :
Amsterdam
Print_ISBN :
978-2-87487-007-1
Type :
conf
DOI :
10.1109/EMICC.2008.4772221
Filename :
4772221
Link To Document :
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