Title :
Cumulative bibliography of articles on semiconductor thermal and temperature testing-1990
Author_Institution :
SAGE Enterprises Inc., Palo Alto, CA, USA
Abstract :
A bibliography of articles on semiconductor thermal and/or temperature characteristics, measurement techniques and results, hardware applications, and other pertinent information is presented
Keywords :
integrated circuit testing; reviews; semiconductor device testing; temperature measurement; thermal resistance measurement; bibliography; hardware applications; measurement techniques; semiconductor device temperature testing; semiconductor device thermal testing; Bibliographies; Chromium; Circuits; Electronic packaging thermal management; Inspection; Microscopy; Plastics; Semiconductor device testing; Temperature measurement; Thermal resistance;
Conference_Titel :
Semiconductor Thermal and Temperature Measurement Symposium, 1990. SEMI-THERM VI, Proceedings., Sixth Annual IEEE
Conference_Location :
Phoenix, AZ
DOI :
10.1109/STHERM.1990.68504
