DocumentCode :
2585321
Title :
A 5.9-to-7.8 GHz VCO in 65 nm CMOS using high-Q inductor in an embedded Wafer Level BGA package
Author :
Issakov, Vadim ; Wojnowski, Maciej ; Knoblinger, Gerhard ; Fulde, Michael ; Pressel, Klaus ; Sommer, Grit
Author_Institution :
Infineon Technol. AG, Neubiberg, Germany
fYear :
2011
fDate :
5-10 June 2011
Firstpage :
1
Lastpage :
4
Abstract :
We present a 5.9-to-7.8 GHz voltage-controlled oscillator (VCO) fabricated in a 65 nm CMOS technology and assembled in a chip-scale embedded Wafer Level Ball-Grid-Array (eWLB) package. The VCO uses a high-quality LC-tank inductor, realized in the fan-out area of the package. This inductor achieves a quality factor of 28 at a frequency of 6.5 GHz. Using this high-Q inductor it was possible to reduce the phase noise by as much as 9 dB at a carrier offset of 1 MHz compared to a reference VCO, which is identical to the first one, but uses an integrated on-chip inductor instead. The VCO using the embedded eWLB inductor offers a phase noise of -118.3 dBc/Hz at 1 MHz and achieves an output power of -1.1 dBm. The VCO core consumes 20.2 mA from a 1.2 V supply. The presented results demonstrate an excellent potential for embedded inductors in the fan-out area of an eWLB package for circuits requiring high-Q inductors.
Keywords :
CMOS integrated circuits; ball grid arrays; inductors; voltage-controlled oscillators; CMOS technology; chip-scale embedded wafer level ball grid array package; current 20.2 mA; embedded inductors; embedded wafer level BGA package; frequency 1 MHz; frequency 5.9 GHz to 7.8 GHz; high-Q inductor; high-quality LC-tank inductor; phase noise; quality factor; reference VCO; size 65 nm; voltage 1.2 V; voltage-controlled oscillator; CMOS integrated circuits; Inductors; Phase noise; Q factor; System-on-a-chip; Tuning; Voltage-controlled oscillators; Voltage-controlled oscillators (VCO); embedded inductors; packages; phase-noise;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Symposium Digest (MTT), 2011 IEEE MTT-S International
Conference_Location :
Baltimore, MD
ISSN :
0149-645X
Print_ISBN :
978-1-61284-754-2
Electronic_ISBN :
0149-645X
Type :
conf
DOI :
10.1109/MWSYM.2011.5972817
Filename :
5972817
Link To Document :
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