DocumentCode
2585339
Title
ADCP bias and stokes drift in AUV-based measurements
Author
Amador, Andre ; Pawlak, Geno ; Jaramillo, Sergio
Author_Institution
Mech. & Aerosp. Eng., Univ. of California San Diego, La Jolla, CA, USA
fYear
2015
fDate
2-6 March 2015
Firstpage
1
Lastpage
5
Abstract
We consider the effects of surface gravity waves on AUV-based acoustic Doppler current profiler (ADCP) measurements. We present data from AUV hydrodynamic surveys in conjunction with current velocity measurements from bottom mounted ADCPs in coral reefs off the coast of Oahu, Hawaii. Transect averaged (100 m) along- and cross-track velocity measurements were calculated on a vehicle-based reference frame and compared with fixed ADCP measurements. Water velocity measurements obtained in a range of wave conditions confirm the presence of a wave-induced bias (Vbw) that is closely related to the Stokes drift. Moreover, AUV-based water velocity measurements are also subject to a wave-induced alias that results from a Doppler shifting of the measured wave velocity field. Waveinduced aliasing can enhance or suppress the bias by an amount that is proportional to the ratio of the vehicle velocity relative to the wave velocity. In addition to the wave-induced bias and consistent with a previously reported behavior, the data suggests the presence of an additional bias in the direction of the vehicle motion.
Keywords
gravity waves; ocean waves; oceanographic techniques; ADCP bias; AUV hydrodynamic surveys; AUV-based ADCP measurements; AUV-based measurements; Doppler shifting; Hawaii; Oahu coast; Stokes drift; acoustic Doppler current profiler; along-track velocity measurement; coral reefs; cross-track velocity measurement; surface gravity waves; vehicle-based reference frame; wave velocity field; wave-induced alias; Current measurement; Doppler effect; Extraterrestrial measurements; Propagation; Sea measurements; Vehicles; Velocity measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Current, Waves and Turbulence Measurement (CWTM), 2015 IEEE/OES Eleventh
Conference_Location
St. Petersburg, FL
Print_ISBN
978-1-4799-8418-3
Type
conf
DOI
10.1109/CWTM.2015.7098146
Filename
7098146
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