• DocumentCode
    2585404
  • Title

    2-6 GHz GaN MMIC Power Amplifiers for Electronic Warfare Applications

  • Author

    Gonzalez-Garrido, M. Angeles ; Grajal, Jesus ; Cubilla, Pablo ; Cetronio, Antonio ; Lanzieri, Claudio ; Uren, Mike

  • Author_Institution
    ETSIT, Univ. Politec. de Madrid, Madrid
  • fYear
    2008
  • fDate
    27-28 Oct. 2008
  • Firstpage
    83
  • Lastpage
    86
  • Abstract
    This paper presents two MMIC broadband high power amplifiers of 4 mm of periphery at the output stage in the frequency band 2-6 GHz. The amplifiers are based on Al-GaN/GaN high electron mobility transistor (HEMT) technology on SiC substrate. They have been fabricated in two different european foundries: SELEX Sistemi Integrati and QINETIQ. SELEX has a gate process technology of 0.5 mum, and devices of 10times100 mum periphery in microstrip technology and QINETIQ has a gate-length of 0.25 mum, and devices of 8times125 mum in coplanar technology. The coplanar amplifier from QINETIQ has demonstrated an output power of 8 W in continuous wave at Vds=20 V which confirm model predictions. On the other hand, SELEX microstrip amplifier has a saturation power of 10 W CW at Vds=25 V and 4 GHz. This amplifier measured on-wafer in pulsed conditions exhibits a maximum power of 17 W at Vds=30 V.
  • Keywords
    HEMT integrated circuits; III-V semiconductors; MMIC power amplifiers; aluminium compounds; electronic warfare; gallium compounds; high electron mobility transistors; wide band gap semiconductors; AlGaN-GaN; MMIC broadband high power amplifiers; SiC; bandwidth 2 GHz to 6 GHz; coplanar amplifier; electronic warfare; gate process technology; high electron mobility transistor; microstrip amplifier; power 10 W; saturation power; size 0.25 mum; voltage 20 V; voltage 25 V; Broadband amplifiers; Electronic warfare; Gallium nitride; HEMTs; High power amplifiers; MMICs; Microstrip; Power amplifiers; Pulse amplifiers; Pulse measurements;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Integrated Circuit Conference, 2008. EuMIC 2008. European
  • Conference_Location
    Amsterdam
  • Print_ISBN
    978-2-87487-007-1
  • Type

    conf

  • DOI
    10.1109/EMICC.2008.4772234
  • Filename
    4772234