DocumentCode :
2585473
Title :
Experimental Determination and Modification of Anand Model Constants for Pb-Free Material 95.5Sn4.0Ag0.5Cu
Author :
Wang Qiang ; Liang Lihua ; Chen Xuefan ; Weng Xiaohong ; Yong Liu
Author_Institution :
Fairchild-ZJUT Microelectron. Packaging Joint Lab., Zhejiang Univ. of Technol., Hangzhou
fYear :
2007
fDate :
16-18 April 2007
Firstpage :
1
Lastpage :
9
Abstract :
A series of tensile tests for pb-free solder material 95.5Sn4.0Ag0.5Cu are conducted under a wide range of temperatures and constant strain rates to obtain the required data for fitting the material parameters of the Anand model. Based on these test results, empirical equations of the tensile strength, elastic modulus and yield stress are fitted as a functions of temperature. It is found that the temperature and strain rate have demonstrated crucial effects on tensile and creep properties of SnAgCu solder material. The test results have also displayed certain viscoplastic behavior, temperature dependence, strain rate sensitivity and creep resistance. A procedure for the determination of Anand material parameters through data fitting is proposed. In order to capture experimental data accurately, a modified Anand model with certain parameters which are the functions of the temperature and strain rate with the quadratic polynomial formula is discussed. Good agreements between the modified model prediction and experimental data have been obtained.
Keywords :
copper alloys; creep; elastic moduli; silver alloys; solders; tensile strength; tensile testing; tin alloys; viscoplasticity; yield stress; Anand model; SnAgCu; creep resistance; elastic modulus; lead-free solder material; strain rate sensitivity; tensile strength; tensile tests; viscoplastic behavior; yield stress; Capacitive sensors; Conducting materials; Creep; Equations; Materials testing; Temperature dependence; Temperature distribution; Temperature sensors; Tensile strain; Tensile stress; Anand model; Lead-free material; tensile tests;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Thermal, Mechanical and Multi-Physics Simulation Experiments in Microelectronics and Micro-Systems, 2007. EuroSime 2007. International Conference on
Conference_Location :
London
Print_ISBN :
1-4244-1105-X
Electronic_ISBN :
1-4244-1106-8
Type :
conf
DOI :
10.1109/ESIME.2007.359957
Filename :
4201154
Link To Document :
بازگشت