DocumentCode :
2585489
Title :
Numerical Simulation and Thermal Failure Analysis of SOM Package
Author :
Kim, Jae Choon ; Jin Taek Chung ; Lee, Won Suk ; Kim, Gyoung Bum ; Lee, Dong Jin ; Cho, Ji-Man ; Yu, Ji-Hyuk ; Ju, Byeong-Kwon ; Hang, SungWoo ; Park, Heung-Woo ; Yun, Sang-Kyeong
Author_Institution :
Dept. of Mech. Eng., Korea Univ., Seoul
fYear :
2007
fDate :
16-18 April 2007
Firstpage :
1
Lastpage :
5
Abstract :
This paper presents a numerical analysis and experimental study on failure of the spatial optical modulators (SOM) package and its preventing from thermal damage. The SOM package has been developed for projection displays. Most heat sources of the SOM package were mounted on a glass plane that was coated with SiO2 and TiO2 for optical performance. The heat sources were distributed by entering the laser beam to the operating mirror, heating of IC chip and ohmic heating in the circuit of glass plane. In designing the SOM package, it is important to consider the thermal influence to the SOM package´s performance and reliability. In this study, the electrical and thermal simulation by CFD and experiments using infrared camera are carried out for the enhancement of thermal reliability. The results are in good agreement with the experiments results and the maximum temperature of glass plane was decreased by the change of glass plane structure change.
Keywords :
computational fluid dynamics; display instrumentation; failure analysis; glass structure; image sensors; laser beams; optical projectors; reliability; silicon compounds; spatial light modulators; thermal management (packaging); titanium compounds; IC chip heating; SOM package; SiO2; TiO2; computational fluid dynamics; electrical simulation; glass plane structure change; heat sources; infrared camera; laser beam; ohmic heating; package reliability; projection displays; spatial optical modulators; thermal damage; thermal failure analysis; thermal reliability; thermal simulation; Displays; Failure analysis; Glass; Heating; Laser beams; Mirrors; Numerical analysis; Numerical simulation; Optical modulation; Packaging;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Thermal, Mechanical and Multi-Physics Simulation Experiments in Microelectronics and Micro-Systems, 2007. EuroSime 2007. International Conference on
Conference_Location :
London
Print_ISBN :
1-4244-1105-X
Electronic_ISBN :
1-4244-1106-8
Type :
conf
DOI :
10.1109/ESIME.2007.359958
Filename :
4201155
Link To Document :
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