• DocumentCode
    2585489
  • Title

    Numerical Simulation and Thermal Failure Analysis of SOM Package

  • Author

    Kim, Jae Choon ; Jin Taek Chung ; Lee, Won Suk ; Kim, Gyoung Bum ; Lee, Dong Jin ; Cho, Ji-Man ; Yu, Ji-Hyuk ; Ju, Byeong-Kwon ; Hang, SungWoo ; Park, Heung-Woo ; Yun, Sang-Kyeong

  • Author_Institution
    Dept. of Mech. Eng., Korea Univ., Seoul
  • fYear
    2007
  • fDate
    16-18 April 2007
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    This paper presents a numerical analysis and experimental study on failure of the spatial optical modulators (SOM) package and its preventing from thermal damage. The SOM package has been developed for projection displays. Most heat sources of the SOM package were mounted on a glass plane that was coated with SiO2 and TiO2 for optical performance. The heat sources were distributed by entering the laser beam to the operating mirror, heating of IC chip and ohmic heating in the circuit of glass plane. In designing the SOM package, it is important to consider the thermal influence to the SOM package´s performance and reliability. In this study, the electrical and thermal simulation by CFD and experiments using infrared camera are carried out for the enhancement of thermal reliability. The results are in good agreement with the experiments results and the maximum temperature of glass plane was decreased by the change of glass plane structure change.
  • Keywords
    computational fluid dynamics; display instrumentation; failure analysis; glass structure; image sensors; laser beams; optical projectors; reliability; silicon compounds; spatial light modulators; thermal management (packaging); titanium compounds; IC chip heating; SOM package; SiO2; TiO2; computational fluid dynamics; electrical simulation; glass plane structure change; heat sources; infrared camera; laser beam; ohmic heating; package reliability; projection displays; spatial optical modulators; thermal damage; thermal failure analysis; thermal reliability; thermal simulation; Displays; Failure analysis; Glass; Heating; Laser beams; Mirrors; Numerical analysis; Numerical simulation; Optical modulation; Packaging;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Thermal, Mechanical and Multi-Physics Simulation Experiments in Microelectronics and Micro-Systems, 2007. EuroSime 2007. International Conference on
  • Conference_Location
    London
  • Print_ISBN
    1-4244-1105-X
  • Electronic_ISBN
    1-4244-1106-8
  • Type

    conf

  • DOI
    10.1109/ESIME.2007.359958
  • Filename
    4201155