Title :
Industrial combining RF and system test of microwave devices using QPSK modulation
Author :
Sahyoun, Walaa ; Duchamp, Jean-Marc ; Benech, Philippe
Author_Institution :
IMEP-LAHC Lab., Grenoble, France
Abstract :
Vector Network Analyzer is considered as the classical characterization instrument for RF-devices but it requires time, equipments and increases the cost of tested equipments. A new method is presented and suggested for industrial test of microwave devices. This procedure is based on EVM system-parameter linked to transmission S-parameter. The procedure of the test is easier and six times faster than VNA test. A single value of EVM allows knowing the functionality of the device and few points describe the RF-device characteristics. First tests were done on Butterworth filters of different orders.
Keywords :
Butterworth filters; microwave devices; quadrature phase shift keying; Butterworth filters; EVM system parameter; QPSK modulation; RF-device characteristics; VNA test; microwave device; system test; transmission S-parameter; vector network analyzer; Band pass filters; Frequency measurement; Information filters; Microwave filters; Phase shift keying; Resonator filters; ADS Ptolemy simulator; EVM; QPSK; RF characterization; VNA measurements; time of test;
Conference_Titel :
Microwave Symposium Digest (MTT), 2011 IEEE MTT-S International
Conference_Location :
Baltimore, MD
Print_ISBN :
978-1-61284-754-2
Electronic_ISBN :
0149-645X
DOI :
10.1109/MWSYM.2011.5972835
